The NTFL Presents Research at the 2015 International Electron Device Meeting

December 19, 2015

NTFL Ph.D. candidate, Erich Radauscher, recently attended the 61st annual IEEE International Electron Devices Meeting (IEDM) in Washington D.C., where he gave a talk on recent work titled "Eliminating Proximity Effects and Improving Transmission in Field Emission Vacuum Microelectronic Devices for Integrated Circuits."

This work evaluates critical performance limiting characteristics (specifically: crosstalk and transmission efficiency) in integrated field emission vacuum microelectronic devices (FE-VMDs). Experimental evidence was used to show proximity effects could not be neglected; while simulations were used to understand the root cause, design structural solutions, and improve overall device performance. New design features were proposed and characterized for improved integration.